m|wheel
Wheel roughness measurement device
Precisely Measuring Wheel Roughness.
Safe and Quiet Rail Transport Starts Here.
m|wheel is a measurement device designed for high-precision measurements of the running surfaces of railway wheels, including roughness, polygonization, eccentricity, and ovality. Whether for maintenance cycles or noise emission predictions, the wheel roughness measurement device provides reliable data even under the toughest conditions.
m|wheel Application Areas
- Measurement and evaluation of acoustic wheel roughness
- Measurement and evaluation of wheel out-of-roundness (polygonization, eccentricity, ovality)
- Detection and analysis of flat spots and other wheel defects
- Measurement of wheel diameter
- Acquisition of input data for acoustic simulations
- Quality assurance
- Research and development
m|wheel Benefits
- Portable solution for workshops, research, and acoustics
- Power supply via USB connection
- Simple and fast measurement as well as evaluation
- Quick and easy attachment of the device to the rail
- Direct adjustment of the sensor position
- Automatic start & stop via magnetic sensor
- Real-time display of the measurement signal: polar and Cartesian diagrams
- Metrologically traceable calibration (EN 15610:2019)
Tailored Measurement and Analysis Software
m|wheel analyse
- Data acquisition
- Real-time graphical display of the roughness signal during measurement (Cartesian plot)
- Graphical display of the acquired measurement data in Cartesian and polar plots
- Calculation and graphic display of one-third octave band roughness spectrum, narrowband spectrum and order spectrum
- Includes limit curves from relevant standards as well as polygon assessment curves
- Wheel out-of-roundness / roundness deviation: polygonization, wheel out-of-roundness, ovality, eccentricity [UIC B 169/DT 405], [EN 15313]
Extended analyse functionality
- Spike removal and curvature correction in accordance with EN 15610
- Roughness single value indicator
- Averaging of measurement data from any wheels and measurement traces
- Standard-compliant display of third-octave band spectra
- Automatic reporting function
- Export of third-octave band level spectra and order level spectra
